Research data supporting "Investigation of wurtzite formation in MOVPE-grown zincblende GaN epilayers on AlxGa1-xN nucleation layers"
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https://www.repository.cam.ac.uk/handle/1810/337300
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资源简介：
The data consists of Scanning transmission electron microscopy based Energy-dispersive X-ray spectroscopy measurements. Data consists of the information from the Line profile obtained across the AlGaN (x=0.29) nucleation layer for different elements such as Si Kα, Pt Mα, Ga Lα, Al Kα. The second file (dm3 file) is a cross-sectional HRTEM image (zone axis = [110]) of the zb-GaN epilayer on GaN NL grown over 3C-SiC, shown in figure 1 of the associated publication (https://doi.org/10.1063/5.0077186).
提供机构：
Apollo - University of Cambridge Repository
创建时间：
2022-02-17
