X-ray diffraction data for APt2Si2, A = Nd, Pr
收藏DataONE2026-02-11 更新2026-02-21 收录
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This dataset consists of temperature dependent x-ray diffraction text files for two systems NdPt2Si2 and PrPt2Si2 and was collected at Argonne National Laboratory. The analysis on this system has been completed and ready for the submission for publication and we are making the experimental text files available and are compressed zipped folder.
创建时间：
2026-02-14
