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Xenon plasma-focused ion beam milling for fabrication of high-purity, bright single-photon sources operating in the C-band

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DataCite Commons2025-01-21 更新2025-04-16 收录
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https://repod.icm.edu.pl/citation?persistentId=doi:10.18150/W3NIHT
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资源简介:
The repository includes worksheet that contains all the experimental results demonstrated in figures 2,3,4,5, as it is published in M. Jaworski et al Opitcs Express 32, 41089-41101 (2024) - (ocd file, read only). There are also deposited data separately for each plot in csv format.Figure 2 demonstrates numerical results generated using Ansys Lumerical software.Figure 3 demonstrates experimental results obtained in microphotoluminescence experiment for single InAs quantum dot resolved spectrally on monochromator and linear detector system.Figure 4 demonstrates experimental results obtained in resolved spectrally on fiber-based filtering system and superconducting nanowire single photon detector (a,b) and correlation events collected using Hanbury-Brown-Twiss setup.Figure 5 demonstrates experimental results obtained in microphotoluminescence experiment resolved spatially on a planar structure containign single QDs. The images are transmitted through long pass (c) and band pass optical filters (b,c). It contains also PL spectra obtained before and after processing by Xe-plasma enhanced focused ion beam.
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RepOD
创建时间:
2025-01-16
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