X-ray diffraction (XRD) patterns of bulk boron and exfoliated borophene with different numbers of layers (six, four, and three)
收藏DataCite Commons2026-03-19 更新2026-05-04 收录
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https://mostwiedzy.pl/en/open-research-data/x-ray-diffraction-xrd-patterns-of-bulk-boron-and-exfoliated-borophene-with-different-numbers-of-layers-six-four-and-three,318033228328582-0
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资源简介：
The crystal structure of borophene samples was tested using X-ray diffraction technique (XRD). XRD patterns were collected with the Malvern Panalytical Aeris instrument, utilizing CuKα radiation.
提供机构：
Gdańsk University of Technology
创建时间：
2026-03-18
