Tomographic surface X-ray diffraction at ESRF-EBS

We are developing Tomographic Surface X-ray Diffraction (TSXRD) for operando surface-structure measurements of polycrystalline samples. This enables a direct comparison of grains with different surface orientations under similar conditions, as well as studies of more realistic model systems than single crystals. We have previously performed measurements at beamline P21.2 at PETRA III and developed software to map the surface grains and extract Crystal Truncation Rods (CTRs) and superstructure rods (SRs) for surface studies. Here, we propose to implement this method at ID31 to make use of the high brilliance of a fourth-generation synchrotron, for which the method was originally intended. Mapping the surface at P21.2 takes about 2 hours. Making full use of the higher brilliance at ID31 would push down the time to minutes, making the method suitable for operando measurements.