Example data for "Calibration of X-ray computed tomography for surface topography measurement using metrological characteristics"
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Example raw data used to create figures during the conference paper "Calibration of X-ray computed tomography for surface topography measurement using metrological characteristics", presented at euspen’s 21st International Conference & Exhibition 2020 Data in the ".datx" format are acquired using a ZYGO NexView NX2 coherence scanning interferometer. Data in the ".stl" format are acquired using a Nikon MCT 225 X-ray computed tomography instrument.
创建时间：
2022-02-24
