Raw measurement data: X-ray reflectometry, optical reflectance spectra and influence of light illumination on the magnetotransport properties of bismuth thin films with and without implantation of antimony ions

A set of raw measurement data, collected as a result of implementation of the project entitled
„Wpływ światła na własności magnetotransportowe cienkich warstw bizmutu, domieszkowanych przez implantację jonową”
(„Magneto-transport influenced by light in bismuth thin films doped by ion implantation”).
The project was financed by the National Science Centre within the MINIATURA8 program.
The data contain the results of measurements of two groups of materials - bismuth thin films before and after implantation of antimony ions.
Thin films of the initial thickness 10-120 nm were deposited on slightly conductive boron-doped silicon (100) wafers and later implanted.
Both implanted and unimplanted samples were studied.

The dataset contains the following data, collected from both unimplanted and implanted samples:
-X-ray diffraction and reflectometry data
-field dependence of resistance and Hall resistance with and without light illumination
-SEM imaging
-spectrophotometry data - wavelength dependence of diffuse reflection coefficient