Impact of dopants geometry of conjugated -C=C- bonds on the memristive properties of nanometric layers of ordered polymethacrylate brushes grafted from surfaces

This repository contains raw source data that has been collected and published in the form of an article. All data are presented as figures in the main text and in the supporting information. The description of the equipment, the procedure and conditions of individual measurements, as well as the methods of synthesis and modification of materials are described in detail in the text of the publication.In detiails this repository contains the following data:Fig 2. AFM images, FTIR and XPS spectra of native poly(TPM) brushes, poly(TPM) brushes after cleavage of protecting TMS groups and poly(TPM) brushes after self-template polymerization;Fig 3. AFM topography images and images with scratches to determine thickness ot the polymer layers, XPS spectra for native poly(TPM) brushes and poly(TPM) brushes modified with CuCl2 and FeCl3 salts (10 and 60 min);Fig 4. I-V scans, KP measurements with WF calculations for all native and dopped poly(TPM) samples;Fig S1. FTIR spectrum of TPM monomer;Fig S2. H-NMR spectrum of TPM monomer;Fig S3. C-NMR spectrum of TPM monomer;Fig S4. AFM images with scratches to determine thickness ot the poly(TPM) layers after 2h, 4h, 8h and 12h of PIPM reaction time;Fig S5 and Table S1. XPS survey spectrum for poly(TPM) brushes after self-template polymerization doped with FeCl3 and CuCl2 after 10 min and 60 min of doping reaction;Table S2. DFT simulation data'Fig S6. I-V scans for various voltage ranges.