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Whole Genome Sequences of the Tea Leaf Spot Pathogen Didymella bellidis

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NIAID Data Ecosystem2026-03-11 收录
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The fungal pathogen Didymella bellidis causes leaf spot on tea (Camellia sinensis (L.) Kuntze), which leads to a loss in tea leaf production in Guizhou Province, China. D. bellidis isolate GZYQYQX2B was sequenced using Illumina HiSeq and Pacific Biosciences (PacBio) SMRT technologies.

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2020-01-14
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