Supplementary Material
收藏DataCite Commons2026-03-02 更新2026-03-28 收录
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https://aip.figshare.com/articles/dataset/Supplementary_Material/31203688/1
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资源简介：
The supplementary material contains detailed information on sample fabrication and characterization methods; tables that summarize the dependence of films properties on annealing conditions; additional figures of transport analysis of annealed germanide or germanosilicide films; the dependence of transport properties of strained Ge quantum wells on annealing conditions; and the methods for the analysis of IrGe lattice constants and microcrystal sizes.
提供机构：
AIP Publishing
创建时间：
2026-03-02
