Single-event characterization of 7-nm technology node using neutron beam at C...

Semiconductor industry is currently offering 7 nm technology node with FinFET fabrication processes. Soft error causing mechanisms and error rates for FinFET technologies are...当前半导体行业已推出采用鳍式场效应晶体管（FinFET）制造工艺的7纳米技术节点，针对该技术的软错误（Soft error）诱发机制与错误率……