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Association between sociodemographic, internet and electronic devices exposure factors, burnout, and fatigue with technostress level among HCWs using univariate analysis.

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NIAID Data Ecosystem2026-05-02 收录
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Association between sociodemographic, internet and electronic devices exposure factors, burnout, and fatigue with technostress level among HCWs using univariate analysis.

创建时间:
2025-03-17
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