Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]

Name: Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films [Dataset]
Creator: DIGITAL.CSIC
Published: 2025-05-07 02:15:35
License: 暂无描述

DataCite Commons2025-05-07 更新2025-05-10 收录

下载链接：

https://digital.csic.es/handle/10261/388498

下载链接

链接失效反馈

官方服务：

资源简介：

Atomic force microscopy data, AFM data.- AFM images can be visualized with Gwyddion (free software)

提供机构：

DIGITAL.CSIC

创建时间：

2025-05-07