Supplemental Information
收藏DataCite Commons2024-12-03 更新2025-01-04 收录
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https://aip.figshare.com/articles/dataset/Supplemental_Information/27829188/1
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资源简介：
Discussion of additional sample growth details and
processing details, an expanded discussion of Burstein Moss
and bandgap renormalization, illustrations of the criteria distinguishing between the TE and TFE regimes, details of the
numerical tunneling model used to fit the reverse IV of the
SBDs, and tabulated historical Schottky barrier height measurements.
提供机构：
AIP Publishing
创建时间：
2024-12-03
