Supplementary Material
收藏DataCite Commons2026-03-19 更新2026-03-28 收录
下载链接：
https://aip.figshare.com/articles/dataset/Supplementary_Material/31109146/1
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资源简介：
Details on ToF-SIMS analysis, additional ToF-SIMS data on surface contaminants and hydrogen trapping, high-field behavior of RT at 25 MV/m, and a study demonstrating that partial vs fully grown surface oxide has no effect on RT.
提供机构：
AIP Publishing
创建时间：
2026-03-19
