Nanostructured copper - defects density, passive layers chemical composition, antibacterial properties SONATA BIS 11 2021/42/E/ST5/00118

<p>The study presents a database of X-ray photoelectron spectroscopy (XPS) measurements results, Doppler broadening variable energy positron annihilation spectroscopy (DB-VEPAS) measurements results, variable energy positron annihilation lifetime spectroscopy (VEPALS) measurements results, and luminous intensity measurements results  (after adhesion tests using <em>S. aureus</em>) for annealed and high-pressure torsion (HPT) processed copper. </p><p><br />XPS spectra have been collected using Microlab 350 spectrometer, Thermo Electron.  A non-monochromatic X-ray source (Al Kα) with an energy of 1486.6 eV for the most intense line and a power of 300 W was used for XPS measurements. Spectra were obtained with a 100 eV pass energy for the survey scan and 40 eV pass energy for narrow regions (high-resolution spectra).</p><p><br />DB-VEPAS measurements have been conducted at the apparatus for in-situ defect analysis (AIDA) of slow positron beamline (SPONSOR) in HZDR, Germany. Positrons were accelerated and implanted with defined kinetic energies into samples in the positron implantation energy range of Ep &#61; 0.05-35 keV. VEPALS measurements were conducted at the Mono-energetic Positron Source (MePS) beamline at HZDR, Germany using a CrBr₃scintillator detector coupled to a Hamamatsu R13089-100 photomultiplier (PMT) tube and a processing unit the SPDevices ADQ14DC-2X digitizer. The time resolution function was in the range of 0.250 ns. All spectra contained at least 1·10⁷ counts.</p><p><br />The areas of the image occupied by fluorescent light (indicating the presence of bacteria) have been calculated using the ImageJ program. The luminous intensity was calculated as the surface fraction of pixels above a certain intensity level.<br /><br /></p>