Dataset of electrical and thermal measurements of Si IGBT under accelerated p...

This dataset contains electrical and thermal measurements of silicon (Si) IGBT power transistors subjected to accelerated power cycling aging tests until complete failure....本数据集包含经受加速功率循环老化试验直至完全失效的硅（Si）绝缘栅双极型晶体管（IGBT）功率晶体管的电学与热学测量数据。