Optical constants of MgxZn1-xO
收藏DataCite Commons2025-03-04 更新2025-04-16 收录
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Optical constants of Mg(x)Zn(1-x)O films are measured by spectroscopic ellipsometry (M-2000U, J.A. Woollam Co.), where the Mg(x)Zn(1-x)O films are grown on Zn-polar ZnO (0001) substrates by molecular beam epitaxy. Ellipsometric parameters are measured at every 5 degrees of incidence from 50 to 70 degrees in the wavelength range of 193–1667 nm. The analysis employs a model combining the Tauc-Lorentz model and the Johs-Herzinger model, built in the Woollam WVASE32 software.
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NIMS
创建时间：
2025-02-10
