Strain-induced changes on the RIXS spectrum of nickelate thin film

Infinite layer nickelates are a class of materials with increasing interest for the RIXS community. The presence of unconventional superconductivity on the thin films makes these materials 2D analogs of the cuprates. However, important differences exist, one of them being the layer interface proximity properties, which can result, for example, in different substrate-induced strains. The understanding of these properties can lead to material design for applications, by manipulating layers and proximity effects.
For this inhouse, we will test the effect of using the Razorbill Ultraminiature UHV strain cell on the measurement of the spectroscopic signatures of Ni L3 edge for a PrNiO2 (PNO) thin film. We will infer to which point the ex-situ applied strain can transfer from the cell, through the glue, to the substrate, and ultimately to the sample. This will allow us to plan the next experiments on this materials.