Low-Resolution Multispectral EDS - High-Resolution Panchromatic SEM images for close-range Pansharpening testing.

The presented dataset is a supplementary material to the paper [1] and it represents the X-Ray Energy Dispersive (EDS)/ Scanning Electron Microscopy (SEM) images of a shungite-mineral particle. Pansharpening is a procedure for enhancing the spatial resolution of a multispectral image, here the EDS individual bands, with a high-spatial panchromatic image, here the SEM image. Pansharpening techniques are usually tested with remote sensed data, but the procedures have been efficient in close-range MS-PAN pairs as well [3]. The current dataset provides both the MS data in multiple elemental bands and the PAN image associated with the particle angle. All images were captured by a Hitachi SU3500 Scanning Electron Microscope with Thermo Scientific UltraDry SDD EDS, dual detector. The sample is of an uneven nature and presents noise that can be pretreated as in [2], and both the noise-treated and original images are present in the current dataset. The image dimensions are 256 by 192 for the EDS maps and 1024 by 768 for the SEM images, whereas the chemical elements present in the sample are: aluminum (Al), carbon (C), iron (Fe), oxygen (O) and sulfur (S). [1] T. Sihvonen, Z.-S. Duma and S.-P. Reinikainen, “AB-PLS-DA: Pansharpening tailored for scanning electron microscopy and energy-dispersive X-ray spectrometry multimodal fusion,” Micron, 2024, https://doi.org/10.1016/j.micron.2023.103578[2] Z.-S. Duma, T. Sihvonen, V. Reinikainen, J. Havukainen, and S.-P. Reinikainen, “Optimizing Energy Dispersive X-Ray Spectroscopy (EDS) Image Fusion to Scanning Electron Microscopy (SEM) Images”, Micron, 2022, https://doi.org/10.1016/j.micron.2022.103361[3] G. Franchi, J. Angulo, M. Moreaud, and L. Sorbier, “Enhanced EDX images by fusion of multimodal SEM images using pansharpening techniques,” Journal of Microscopy, vol. 269, no. 1, pp. 94–112, 2018.

所提供的数据集为论文[1]的补充材料，代表了一种含有石墨烯矿粒的X射线能量色散(EDS)/扫描电子显微镜(SEM)图像。多光谱图像的空间分辨率增强过程，即在此处为EDS单波段图像与高空间分辨率的全色图像，即SEM图像的结合，称为全色增强。全色增强技术通常用于遥感数据的测试，但其方法在近距离多光谱-全色图像对中亦表现出高效性[3]。当前数据集提供了多波段元素数据以及与粒子角度相关的全色图像。所有图像均由日立SU3500扫描电子显微镜配备赛默飞世尔科技UltraDry SDD EDS双探测器捕获。样本性质不均匀，呈现噪声，可按[2]中的方法进行预处理，且当前数据集中同时包含了经过噪声处理和原始图像。图像尺寸为256x192像素的EDS图谱和1024x768像素的SEM图像，而样本中存在的化学元素包括：铝(Al)、碳(C)、铁(Fe)、氧(O)和硫(S)。[1] T. Sihvonen, Z.-S. Duma和S.-P. Reinikainen, “AB-PLS-DA: 针对扫描电子显微镜和能量色散X射线光谱的多模态融合的全色增强方法，” Micron, 2024, https://doi.org/10.1016/j.micron.2023.103578[2] Z.-S. Duma, T. Sihvonen, V. Reinikainen, J. Havukainen, and S.-P. Reinikainen, “优化能量色散X射线光谱(EDS)图像与扫描电子显微镜(SEM)图像的融合，” Micron, 2022, https://doi.org/10.1016/j.micron.2022.103361[3] G. Franchi, J. Angulo, M. Moreaud, and L. Sorbier, “利用全色增强技术融合多模态SEM图像以增强EDX图像，” Journal of Microscopy, 第269卷，第1期，第94–112页，2018。