Supplementary Material
收藏DataCite Commons2025-06-25 更新2025-07-19 收录
下载链接：
https://aip.figshare.com/articles/dataset/Supplementary_Material/29291435
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资源简介：
XRD patterns and Data set used in the manuscript. XRD patterns were measured out of plane direction. Data set includes the film composition, lattice constants, ordering parameter, saturation magnetization, anisotropy field, and Curie temperature
提供机构：
AIP Publishing
创建时间：
2025-06-11
