X-ray Fluorescence and reflectography data of Ethiopian manuscript CHJN003
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https://www.fdr.uni-hamburg.de/record/10280
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资源简介：
XRF (Artax: 50kV, 600 µA, linescans of 10 points of 50s each each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis of inks and pigments from Ethiopian manuscript CHJN003.
CHJN003_report.pdf - detailed report
CHJN003_reflectography.zip - complete reflectography Dataset
CHJN003_XRF.zip - complete XRF Dataset
提供机构：
Universität Hamburg
创建时间：
2022-07-14
