Neutron soft error effects at 16 and 20 nm technology nodes
收藏B2FIND2026-04-25 收录
下载链接:
https://b2find.eudat.eu/dataset/b1762fdb-8a60-5b69-894c-9d64e36497be
下载链接
链接失效反馈官方服务:
资源简介:
Semiconductor industry is currently offering 16 nm technology node with FinFET fabrication processes. Soft error causing mechanisms and error rates for FinFET technologies are...



