Dispersion relations for MAPI deposited on a Si wafer
收藏Figshare2015-05-06 更新2026-04-29 收录
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https://figshare.com/articles/dataset/Dispersion_relations_for_MAPI_deposited_on_a_Si_wafer/1405683
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Dispersion relations for MAPI deposited on a Si wafer. Measured using variable angle spectroscopic ellipsometry and fit using the following oscillators: - Tauc-LorentzEg 1.55E0 1.63A0 23.9
创建时间:
2015-05-06



