The influence of external interference on AFM imaging, the use of a protective helmet

This collection is of purely practical importance, showing how the presence of external disturbances can adversely affect the quality of imaging with an atomic force microscope. For this reason, it is also advisable to provide a link to a workshop-like study [1] as well as a huge number of commercial solutions available after entering the keyword "AFM antivibration". The laboratory, where these tests were carried out, is equipped with the TS150 anti-vibration stage, which provides active damping of mechanical vibrations in the frequency range from 0.7 to 300 Hz. Additionally, the measuring head can be covered with a protective cover ("helmet") which provides insulation against mechanical air vibrations and electromagnetic fields due to grounding. The differences in the results of imaging in the absence and use of the latter element are presented in this collection (the anti-vibration stage was active in both cases). The scans were made on the surface of a sapphire plate which is very smooth. This allows to see changes in the roughness distribution in both cases, caused by the superimposition of additional external interferences. The collection contains 4 images and 2 histograms of altitude data, first without a hard hat, then with the “helmet” on. Reference: [1] https://www.designworldonline.com/atomic-force-microscope-sees-vibration-isolation/