Structural Properties of TaAs Weyl Semimetal Thin Films Grown by Molecular Beam Epitaxy on GaAs(001) Substrates

Name: Structural Properties of TaAs Weyl Semimetal Thin Films Grown by Molecular Beam Epitaxy on GaAs(001) Substrates
Creator: RepOD
Published: 2023-08-23T09:15:19+08:00

RepOD Repository for Open Data2023-08-23 更新2026-07-23 收录

Weyl半金属薄膜

分子束外延结构表征

数据链接：

https://repod.icm.edu.pl/dataset.xhtml?persistentId=doi:10.18150/WHYV9U 数据链接链接失效反馈

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资源简介：

Sadowski, Janusz; Domagała, Jarosław Z.; Zajkowska, Wiktoria; Kret, Sławomir; Seredyński, Bartłomiej; Gryglas-Borysiewicz, Marta; Ogorzałek, Zuzanna; Bożek, Rafał; Pacuski, Wojciech, 2023, "Structural Properties of TaAs Weyl Semimetal Thin Films Grown by Molecular Beam Epitaxy on GaAs(001) Substrates", https://doi.org/10.18150/WHYV9U, RepOD, V1

提供机构：

RepOD

创建时间：

2023-08-23

Structural Properties of TaAs Weyl Semimetal Thin Films Grown by Molecular Beam Epitaxy on GaAs(001) Substrates

资源简介：

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