Single Event Effects Results for COTS Microcontrollers and Microprocessors
收藏DataCite Commons2024-07-21 更新2025-04-16 收录
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http://dataverse.jpl.nasa.gov/citation?persistentId=doi:10.48577/jpl.D4TURS
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资源简介：
We present single event effects (SEE) results for a variety of microcontrollers and microprocessors. The devices tested include Blackfin embedded processors from Analog Devices, automotive-grade TI and Infineon microcontrollers with multiple safety features, and the MSP430FR5994.
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Root
创建时间：
2024-07-21
