Single Event Effects Results for COTS Microcontrollers and Microprocessors

Name: Single Event Effects Results for COTS Microcontrollers and Microprocessors
Creator: Root
Published: 2024-07-21T09:03:01+08:00

DataCite Commons2024-07-21 更新2025-04-16 收录

单粒子效应

硬件抗辐射评估

数据链接：

http://dataverse.jpl.nasa.gov/citation?persistentId=doi:10.48577/jpl.D4TURS 数据链接链接失效反馈

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资源简介：

We present single event effects (SEE) results for a variety of microcontrollers and microprocessors. The devices tested include Blackfin embedded processors from Analog Devices, automotive-grade TI and Infineon microcontrollers with multiple safety features, and the MSP430FR5994.

提供机构：

Root

创建时间：

2024-07-21

Single Event Effects Results for COTS Microcontrollers and Microprocessors

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