Data underlying Chapter 2 of the PhD thesis: Chemical Imaging Methods for Cultural Heritage: Advanced Data Acquisition and Processing

*** L.M. de Almeida Nieto Ph.D. Dissertation "Chemical Imaging Methods for Cultural Heritage: Advanced Data Acquisition and Processing" Chapter 2: Comparison of macro x-ray fluorescence and reflectance imaging spectroscopy for the semi-quantitative analysis of pigments in easel paintings: A study on lead white and blue verditer Related Data***Authors: L.M. de Almeida Nieto, F. Gabrieli, A. van Loon, V. Gonzalez, J. Dik, R. Van de Plas, M. AlfeldMaterials Science and Engineering Department, Faculty of Mechanical Engineering, DelftUniversity of TechnologyCorresponding author: L.M. de Almeida NietoContact Information:[e-mail] University of Technology - Faculty of Mechanical EngineeringThe Netherlands<br>***General Introduction***This dataset contains all the data relevant to Chapter 2 of L.M. de Almeida Nieto's doctoral dissertation, collected between 2019 and 2023, the results of which are published in:https://doi.org/10.1002/xrs.3394The data in this data set was collected in the Conservation and Science Department of the Rijksmuseum, Amsterdam.This research project was made possible by by funding from the Rijksmuseum and TU Delft.<br>***Purpose of the test campaign***The purpose of these experiments was to evaluate the potential of MA-XRF and RIS for the quantitative analysis of paint layers in easel paintings.<br>***Test equipment***MA-XRF data was acquired using a Bruker M6 jetstream.VNIR-RIS data was acquired using a Surface Optics SOC710-E hyperspectral camera.SWIR-RIS data was acquired using a Headwall Photonics Micro-Hyperspec SWIR 640 hyperspectral camera.

*** L.M. de Almeida Nieto 博士论文《文化遗产化学成像方法：先进数据采集与处理》第2章：宏观X射线荧光与反射成像光谱法对比分析架上绘画颜料的半定量研究——以铅白（lead white）与蓝 verditer（blue verditer）为例 相关数据集***
作者：L.M. de Almeida Nieto、F. Gabrieli、A. van Loon、V. Gonzalez、J. Dik、R. Van de Plas、M. Alfeld
代尔夫特理工大学机械工程学院材料科学与工程系
通讯作者：L.M. de Almeida Nieto
联系方式：[e-mail]
代尔夫特理工大学机械工程学院，荷兰
*** 通用介绍 ***
本数据集涵盖L.M. de Almeida Nieto博士论文第2章的全部相关数据，采集于2019年至2023年间，相关研究成果已发表于：https://doi.org/10.1002/xrs.3394。本数据集的数据采集工作于阿姆斯特丹国立博物馆保护与科学部完成。本研究项目得到了阿姆斯特丹国立博物馆与代尔夫特理工大学的资助。
*** 测试活动目的 ***
本实验旨在评估宏观X射线荧光光谱（macro X-ray fluorescence，MA-XRF）与反射成像光谱（reflectance imaging spectroscopy，RIS）用于架上绘画漆层半定量分析的潜力。
*** 测试设备 ***
MA-XRF数据采用布鲁克（Bruker）M6 Jetstream便携式X射线荧光光谱仪采集；可见近红外反射成像光谱（VNIR-RIS）数据采用Surface Optics SOC710-E高光谱相机采集；短波红外反射成像光谱（SWIR-RIS）数据采用Headwall Photonics Micro-Hyperspec SWIR 640高光谱相机采集。