Charge carrier distribution observation and manipulation in Si-MOS

Name: Charge carrier distribution observation and manipulation in Si-MOS
Creator: PSI
Published: 2024-05-23T23:15:11+08:00

DataCite Commons2026-01-30 更新2024-07-13 收录

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资源简介：

Raw datasets measured in LEM of metal-oxide-semiconductor (MOS) structure. The sample consisted of Al/SiO2/Si.

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2024-05-23