emission images defect samples
收藏Figshare2022-10-13 更新2026-04-28 收录
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https://figshare.com/articles/dataset/emission_images_defect_samples/21280104
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The emission images are manually inspected in order to select 150 images as defected samples and used to create a dataset considered as the ground truth for machine learning Acknowledgement : Thanks to Denis Dowling from I-Form Advanced Manufacturing Research Centre and his team member Darragh Egan based in University College Dublin for the provision of this data
创建时间：
2022-10-13
