Supplement Number 1
收藏DataCite Commons2024-07-29 更新2024-08-18 收录
下载链接：
https://aip.figshare.com/articles/dataset/Supplement_Number_1/26311168
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资源简介：
See the supplementary material for crystal growth, phase, and quality examinations; TEM characterization of stacking fault structures; detailed explanation of the HAADF image processing; specific parameters of the extrema positions in the valence band.
提供机构：
AIP Publishing
创建时间：
2024-07-16
