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Auger recombination in low temperature silicon measured by photo-MuSR technique

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B2FIND2026-04-25 收录
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https://b2find.eudat.eu/dataset/da39a9d7-e57c-5848-972f-11d1e4ec95a9
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We measure electron-hole recombination rate in low-temperature pure silicon using the photo-MuSR technique. The previous works have measured the recombination rate down to -30...
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