Close to You? Bias and Precision in Patent-Based Measures of Technological Proximity
收藏NBER2007-08-01 更新2025-01-04 收录
下载链接：
https://www.nber.org/papers/w13322
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资源简介：
Patent data have been widely used in research on technological innovation to characterize firms' locations as well as the proximities among firms in knowledge space. Researchers could measure proximity among firms with a variety of measures based on patent class data, including Euclidean distance,
提供机构：
美国国家经济研究局
创建时间：
2007-08-01
