Patterned_surface_Si_spheres
收藏DataCite Commons2024-06-14 更新2024-07-13 收录
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资源简介：
Description of sample:
• Silicon sphere used in adhesion tests
Topography was measured using:
1. Atomic Force Microscope (Bruker Dimension Icon VI with TapDLC 3000 tips of radius approximately 20 nm)
Data used in paper: https://doi.org/10.1021/acs.langmuir.4c00669
Tuning Surface Adhesion Using Grayscale Electron-beam Lithography
Authors:
• Arushi Pradhan. Affiliation 1. ORCID: 0000-0001-8169-7900
• Luke A. Thimons. Affiliation 1. ORCID: 0000-0003-4511-1807
• Nickolay Lavrik. Affiliation 2. ORCID: 0000-0002-9543-5634
• Ivan I. Kravchenko. Affiliation 2. ORCID: 0000-0003-4999-5822
• Tevis D.B. Jacobs. Affiliation 1. ORCID: 0000-0001-8576-914X
Affiliations:
1. Department of Mechanical Engineering and Materials Science, University of Pittsburgh, 3700 O’Hara St., Pittsburgh, PA 15208
2. Oak Ridge National Laboratory, Oak Ridge, TN 37830
Corresponding Author: Tevis Jacobs (tjacobs@pitt.edu)
提供机构：
contact.engineering
创建时间：
2024-06-14
