Research data deposit for "Single atom chemical identification of TMD defects in ambient conditions"

Atomic Force Microscopy (AFM) Raw Data Supporting Figures 1–4 of
"Single atom chemical identification of TMD defects in ambient
conditions" Description This dataset contains raw Atomic Force
Microscopy (AFM) scan files used to generate Figures 1–4 in the associated
publication. The data were collected between February 2021 and March 2023
using AFM instrumentation. The files are primarily Bruker .spm scan files.
Each file corresponds to the AFM scan used to generate a specific figure
panel in the publication. The dataset provides the original scan data used
to produce the height maps and line profiles shown in the figures. Where
line profiles are referenced in the paper, these were extracted from the
AFM scans using standard AFM analysis software. File formats .spm — Raw
AFM scan data (Bruker format) The data can be opened and analysed using:
Gwyddion Bruker NanoScope Analysis Other AFM analysis software supporting
.spm files.Description