This dataset includes depth profiles of porosity estimated from electrical resistivity logs for six sites (sites C0001, C0002, C0004, C0006, C0012, and C0024) at the Nankai Trough. Depth profiles are
X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractogr
