XBIC fidelity , sample stability and sample fidelity tests
收藏DataCite Commons2025-11-06 更新2026-05-03 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-2271918339
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资源简介：
x-ray beam induced current from the noise and how to adhere samples to improve their stability in the x-ray beam
提供机构：
European Synchrotron Radiation Facility
创建时间：
2025-11-06
