X-ray data collection and model refinement statistics.
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aValues for crystal no. 1.bValues in parentheses are for the highest resolution shell.cRint = ΣhklΣi|Ii(hkl)−I(hkl)>|/ΣhklΣiIi(hkl), where Ii(hkl) is the ith measurement of the intensity of reflection hkl and I(hkl)> is the mean intensity of reflection hkl.dR = Σ||Fo|−|Fc||/Σ|Fo|, where Fo and Fc are the observed and calculated structure factor amplitudes, respectively.X-ray data collection and model refinement statistics.
创建时间：
2015-12-02
