Back-Side SEM Images and Respective Modified GDSII Chip Designs
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https://b2find.eudat.eu/dataset/5278c019-5a2e-5e97-afbf-cd1fde625cac
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This data set consists of backside scanning electron microscope (SEM) images of four different CMOS integrated circuits (90nm, 65nm, 40nm and 28nm technologies) recorded for...



