Replication Data for: Physical Unclonable Functions based on the post-breakd...

This dataset contains the Id-Vd, Ig-Vg and Id-Vg characteristics measured on FDSOI nanowire transistors after the Dielectric Breakdown (BD) of the gate stack. The measurements...本数据集收录了栅叠层介质击穿（Dielectric Breakdown, BD）后，于全耗尽型绝缘体上硅（FDSOI）纳米线晶体管上测得的漏极电流-漏极电压（Id-Vd）、栅极泄漏电流-栅极电压（Ig-Vg）以及漏极电流-栅极电压（Id-Vg）电学特性，相关测量……