SUPPLEMENTARY MATERIAL

The supplementary material includes fabrication details, SEM images of fabricated samples, scheme of the Z-scan setup, details of beam spatial characterization for Z-scan, additional experimental closed-aperture traces, additional linear transmittance spectra, analysis of linear transmittance spectra, details of theoretical model for closed- and open-aperture traces, theoretical model for effective number of illuminated unit cell, additional notes for numerical simulations, additional numerical simulations for varying lattice period.