PNAS_paper.zip

NIAID Data Ecosystem2026-03-10 收录

纳米生物力学测量

表面形貌分析

数据链接：

https://figshare.com/articles/dataset/PNAS_paper_zip/5894584 数据链接链接失效反馈

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资源简介：

The zip folder PNAS_paper contains the original ibw files for Figs 2, 3 and S1 for the recently accepted paper: Al-Rekabi Z & Contera S. 2018. PNAS. (accepted).

创建时间：

2018-02-15

CMP加工后芯片三维形貌表征参数体系

芯片制造

表面形貌分析

针对当前化学机械抛光(chemical mechanical polishing, CMP)后的芯片表面形貌的表征常常只停留在研究二维轮廓特征，无法完整地表达整个三维表面形貌信息，仅使用单一的评定指标来表征其表面的不平整程度等问题，建立了1个科学、全面的芯片表面形貌评定参数体系应用于工程表面粗糙度评定中，通过分析芯片表面形貌的幅值分布特征，结合芯片表面的统计特性，基于ISO 25178-2标准表征

中国科学院兰州化学物理研究所科学数据中心2023-09-08 更新370

Jumping Wave 2D Profiles

金属滚压工艺

表面形貌分析

The file contains 2D profiles obtained from a jumping wave study in front of the tool during burnishing of 1.0562 steel by the toroidal-cone tool. Burnishing speed 30.5 m/min, feed of burnishing 0.2m

Most Wiedzy Open Research Data Catalog80

AFM (Atomic Force Microscopy) analysis of surface topography loaded with nickel nanoparticles.

纳米材料表征

表面形貌分析

This dataset presents AFM (Atomic Force Microscopy) images depicting the surface topography loaded with nickel powdered nanoparticles. The detailed equipment and measurement data was described in "AFM

Most Wiedzy Open Research Data Catalog50

R67

表面形貌分析

Bruker仪器数据

Bruker contour GT

DataCite Commons2025-04-29 更新130

Surface-topography challenge (Sample A71)

材料科学

表面形貌分析

Atomic force microscopy (AFM) topography images of a chromium nitride (CrN) sample deposited on a prime-grade polished silicon wafer. Six measurements are included with scan sizes of respectively 0.51

DataCite Commons2025-02-10 更新60

PNAS_paper.zip

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