Elements and dust input data from Hulugou peat in the northeastern Qinghai-Tibetan Plateau.xlsx

The resluts of elements was scanned by X-Ray Fluorescence (XRF) using the Geotek Multi-Sensor Core Loggers (MSCL) XRF core scanner. The grain size distributions of peat samples were determined by a laser-optical particle size analyzer Malvern Mastersizer-2000 and analyzed by parameterization End-member Modelling Analysis (EMA). We stacked a curve with EM1 and Ti components for the reconstructed dust input. The age-depth results are constructed by linear interpolation method, and compared with Bacon age-depth model results.