Dispersion relations for MAPI deposited on a Si wafer
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https://figshare.com/articles/dataset/Dispersion_relations_for_MAPI_deposited_on_a_Si_wafer/1405683
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资源简介：
Dispersion relations for MAPI deposited on a Si wafer. Measured using variable angle spectroscopic ellipsometry and fit using the following oscillators:
- Tauc-Lorentz
Eg 1.55
E0 1.63
A0 23.9
创建时间：
2015-05-06
