Dispersion relations for MAPI deposited on a Si wafer
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资源简介：
Dispersion relations for MAPI deposited on a Si wafer. Measured using variable angle spectroscopic ellipsometry and fit using the following oscillators: - Tauc-Lorentz Eg 1.55 E0 1.63 A0 23.9
创建时间：
2015-05-06
