Raw data for: Correlating depth-resolved defect chemistry and operando electrochemical response in compositionally graded GDC/YSZ thin films

This dataset contains raw and processed data supporting the manuscript:"Correlating depth-resolved defect chemistry and operando electrochemical response in compositionally graded GDC/YSZ thin films."The files include experimental data used to generate the figures presented in the manuscript and supporting information, including:- AFM contact potential difference (CPD) maps acquired under external bias- AFM CPD line profile data used for potential gradient analysis- Hard X-ray photoelectron spectroscopy (HAXPES) spectra with binding energy correction- Grazing incidence X-ray diffraction (GIXRD) data- Processed datasets used for the correlation analysis presented in Figure 4- Current density vs external bias characterization dataThese data support the analysis of defect chemistry evolution and electrochemical response in compositionally graded GDC/YSZ thin films.