Monitoring Amine Intercalation in H3Sb3P2O14 Thin Films Based on Real-Time X‑ray Diffraction Data Analysis

Thin films comprised of 2D materials have attracted significant attention, as they can be assembled into novel functional materials. However, to further enhance their application scope, it is necessary to harvest the large property space of 2D materials by fine-tuning them on a molecular level, e.g., by intercalation. In order to fully exploit the potential of intercalated 2D materials and design their properties, it is vital to gain a fundamental understanding of the underlying intercalation mechanism. In this work, we present a method for the quantitative analysis of changes in the peak profile and position observed by in situ synchrotron measurements upon the intercalation of the guest molecule into the layered host. We do this by monitoring the intercalation of n-butylamine (3 M in ethanol) into a H3Sb3P2O14 thin film in real time. Our approach includes a state-of-the-art recursive supercell approach that accounts for peak broadening and shifting caused by randomly occurring intercalation, which enabled quantitative Rietveld refinements of the XRD patterns obtained during the interstratification process. This allowed us to reveal the transient formation of intermediates and the critical role of ethanol, which acts as a vehicle for amine intercalation into the layered host.