UO2 enhanced paramagnetism in thin films: An XMCD verification
收藏Mendeley Data2024-01-31 更新2024-06-29 收录
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https://doi.esrf.fr/10.15151/ESRF-ES-1308372686
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Recently a paper has appeared reporting a huge (factor of > 100) enhancement of the susceptibility in UO2 thin films (< 200 Å) when such a film is deposited on a series of perovskite substrates. The only way to directly prove this startling (and potentially useful in spintronics) result is to measure several films with XMCD at the U M4,5 edges. Samples (deposited on LaAlO3) from a previous experiment of ours, and newer samples made at Bristol University, are available.
创建时间：
2024-01-31
