Data for: Measurement of the optical dielectric properties of thin-lm materials by ultrafast time-resolved interferometry
收藏Mendeley Data2020-02-04 更新2026-04-09 收录
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资源简介：
these are the principle, the sample in the expriment used in this article and the data processing, also the set-up used in this expriment
创建时间：
2020-02-04
